DocumentCode :
2343951
Title :
Experimental study of energy attenuation on the discharge wire in pulse discharge reactor
Author :
Bingyan, Dong ; Dachao, Zhang ; Wei, Ke ; Yan, Wu
Author_Institution :
Sch. of Resources & Environ. Eng., Jiangxi Univ. of Sci. & Technol., Ganzhou
fYear :
2008
fDate :
3-5 June 2008
Firstpage :
1075
Lastpage :
1078
Abstract :
Pulse energy injects into reactor to producing activated radical for the removal of SO2 and NOx from flue gas base on corona discharge as pulse propagate alone discharge wire. For the pulse voltage waveform distortion and pulse energy attenuation alone the discharge wire can influence the numbers of activated radical, so in this paper the characteristics of pulse voltage waveform distortion, and pulse energy attenuation alone the discharge wire have been investigated. The influences of voltage, pulse-forming capacitance, wire diameter and length on pulse energy attenuation also have been studied. The results show that the pulse voltage occurs distortion when it is transmitting. Pulse width and front rise time increase with transmission distance increase. Increasing voltage, pulse-forming capacitance and discharge wire diameter can improve the attenuation rate of pulse energy. Energy attenuation becomes quicker as discharge wire is shorter. The results concluded that discharge wire length should be chosen as shorter as possible for improving the energy efficiency of discharge wire in reactor.
Keywords :
air pollution control; corona; discharges (electric); flue gases; reactors (electric); corona discharge; discharge wire; energy attenuation; flue gas; pulse discharge reactor; pulse energy attenuation; pulse voltage waveform distortion; pulse-forming capacitance; transmission distance; Attenuation; Corona; Flue gases; Inductors; Oscilloscopes; Probes; Pulse amplifiers; Pulse measurements; Voltage; Wire; energy attenuation; pulse discharge; reactor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
Type :
conf
DOI :
10.1109/ICIEA.2008.4582682
Filename :
4582682
Link To Document :
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