Title :
An improved AVPG algorithm for SoC design verification using port order fault model
Author :
Wang, Chun-Yao ; Tung, Shing-Wu ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Embedded cores are being increasingly used in the design of large system-on-a-chip (SoC). Because of the high complexity of SoC the design verification is a challenge for the system integrator. To reduce the verification complexity, the port order fault (POF) model has been used for verifying core-based designs and the corresponding verification pattern generation has been developed. Here we present an automorphic technique to improve the efficiency of the automatic verification pattern generation (AVPG) for SoC design verification based on POF model. On average, the size, of pattern sets obtained on the ISCAS-85 and MCNC benchmarks are 45% smaller and the run time decreases 16% as compared with the results of AVPG
Keywords :
application specific integrated circuits; automatic test pattern generation; fault simulation; formal verification; graph theory; integrated circuit design; integrated circuit modelling; redundancy; AVPG algorithm; ISCAS-85 benchmarks; MCNC benchmarks; POF model; SoC design verification; automatic verification pattern generation; automorphic technique; core-based designs; design verification; embedded cores; pattern sets; port order fault model; run time; verification complexity; Acceleration; Algorithm design and analysis; Cost function; Councils; Design methodology; Fault detection; Manufacturing; System-on-a-chip; Testing; Time to market;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990321