Title :
Efficient pattern-based verification of connections to IP cores
Author :
Polian, Ilia ; Günther, Wolfgang ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-University, Freiburg, Germany
Abstract :
Verification of designs containing pre-designed cores is a challenging topic in modern IC design. Traditional approaches generally do not use the information that parts of the design (like IP cores) are already verified. In this case, the verification of the IP core reduces to verifying the connectivity between the surrounding design and the core. Therefore, we propose a method that is based on test patterns. Using only those patterns for simulation, in almost all cases 100% of the errors can be detected. Existing test access logic is employed for the application of the patterns. A large set of experimental results is given to demonstrate the efficiency of the approach
Keywords :
automatic test pattern generation; binary decision diagrams; circuit CAD; design for testability; fault simulation; formal verification; industrial property; integrated circuit design; logic CAD; IC design; IP cores; connectivity; efficiency; pattern-based verification; pre-designed cores; test access logic; test patterns; verification; Circuit faults; Circuit testing; Intellectual property; Libraries; Logic testing; Manufacturing processes; Observability; Protection; Signal design; Test pattern generators;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990324