DocumentCode :
2344022
Title :
Efficient pattern-based verification of connections to IP cores
Author :
Polian, Ilia ; Günther, Wolfgang ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-University, Freiburg, Germany
fYear :
2001
fDate :
2001
Firstpage :
443
Lastpage :
448
Abstract :
Verification of designs containing pre-designed cores is a challenging topic in modern IC design. Traditional approaches generally do not use the information that parts of the design (like IP cores) are already verified. In this case, the verification of the IP core reduces to verifying the connectivity between the surrounding design and the core. Therefore, we propose a method that is based on test patterns. Using only those patterns for simulation, in almost all cases 100% of the errors can be detected. Existing test access logic is employed for the application of the patterns. A large set of experimental results is given to demonstrate the efficiency of the approach
Keywords :
automatic test pattern generation; binary decision diagrams; circuit CAD; design for testability; fault simulation; formal verification; industrial property; integrated circuit design; logic CAD; IC design; IP cores; connectivity; efficiency; pattern-based verification; pre-designed cores; test access logic; test patterns; verification; Circuit faults; Circuit testing; Intellectual property; Libraries; Logic testing; Manufacturing processes; Observability; Protection; Signal design; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
ISSN :
1081-7735
Print_ISBN :
0-7695-1378-6
Type :
conf
DOI :
10.1109/ATS.2001.990324
Filename :
990324
Link To Document :
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