Title :
Experimental results of forward-looking reverse order fault simulation on industrial circuits with scan
Author :
Pomeranz, Irith ; Reddy, Sudhakar M. ; Lin, Xijiang
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Discusses an improved procedure named forward-looking fault simulation. The term forward-looking refers to the fact that certain tests are dropped because they are not necessary for detecting faults that will be detected later in the simulation process. The authors discuss an efficient implementation of forward-looking fault simulation in an industrial environment. They concentrate on reverse order fault simulation. Parallel pattern single fault propagation (PPSFP) simulation is used throughout the implementation of the forward-looking reverse order fault simulation process, since PPSFP is known to result in fast fault simulation for industrial circuits
Keywords :
automatic testing; boundary scan testing; fault diagnosis; fault simulation; logic testing; forward-looking reverse order fault simulation; industrial circuits; parallel pattern single fault propagation; scan under test sets; simulation process; stuck-at faults; transition faults; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Computer simulation; Electrical fault detection; Fault detection; Fault diagnosis; Graphics;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990334
