• DocumentCode
    2344286
  • Title

    3.5 kV trench dual-gate MOS controlled thyristor

  • Author

    Mehrotra, M. ; Thapar, N. ; Baliga, B.J.

  • Author_Institution
    Power Semicond. Res. Center, Raleigh, NC, USA
  • fYear
    1996
  • fDate
    26-26 June 1996
  • Firstpage
    52
  • Lastpage
    53
  • Abstract
    The Insulated Gate Bipolar Transistor (IGBT) offers excellent characteristics for 600-2000 V applications such as in motor control. However, the on-state voltage drop of the IGBT becomes very high when the blocking voltage is increased. MOS-gated thyristors have been reported that utilize current flow via thyristor action to obtain a low on-state voltage drop. However, these devices lack forward bias safe operating area (FBSOA), which makes it difficult to protect the device against short circuit failure. This paper presents a new device structure, the trench dual gate MOS controlled thyristor (T-DGMCT), that exhibits low on-state voltage drop like a MOS Controlled Thyristor (MCT) and current saturation (FBSOA) characteristics like an IGBT while operating at high (3.5 kV) voltages.
  • Keywords
    MOS-controlled thyristors; 3.5 kV; T-DGMCT; current saturation; forward bias safe operating area; on-state voltage drop; trench dual-gate MOS controlled thyristor; Analytical models; Cathodes; Charge carrier lifetime; Current density; Electrical resistance measurement; Insulated gate bipolar transistors; Low voltage; MOSFET circuits; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1996. Digest. 54th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-3358-6
  • Type

    conf

  • DOI
    10.1109/DRC.1996.546311
  • Filename
    546311