Title :
PWM controlled single-stage converter operating in DCM/CCM for universal off-line applications
Author :
Wu, T.-F. ; Liang, S.-A. ; Chen, Y.K. ; Yang, C.-H.
Author_Institution :
Power Electron. Appl. Res. Lab., Nat. Chung Cheng Univ., Chia-Yi, Taiwan
Abstract :
A single-stage converter (SSC) operating either in discontinuous conduction mode (DCM) or in continuous conduction mode (CCM) to achieve high power factor, high efficiency and low stress for universal line voltage range from 90 Vac to 264 Vac is presented. At light load, the proposed system is operated in the DCM; while at heavy load the system is operated in the CCM; thus, the DC-link voltage can be properly controlled to a certain voltage. The overall system is controlled with a pulse width modulation robust control and with a fixed frequency. In the design, the load variation and line voltage variation are treated as plant uncertainties. The H/sup /spl infin// robust control method is adopted to design a proper robust controller to achieve robust stability and robust performance. Finally, a prototype is implemented to verify the effectiveness and feasibility of the analysis and design.
Keywords :
DC-DC power convertors; H/sup /spl infin control; PWM power convertors; control system synthesis; power factor; robust control; uncertain systems; voltage control; 90 to 264 V; DC-link voltage control; H/sup /spl infin// robust control method; PWM controlled single-stage converter; buck-boost stage; continuous conduction mode; discontinuous conduction mode; flyback stage; heavy load; high efficiency; high power factor; light load; line voltage variation; load variation; low stress; plant uncertainties; pulse width modulation robust control; robust controller design; robust performance; robust stability; universal off-line applications; Control systems; Lighting control; Pulse width modulation; Pulse width modulation converters; Reactive power; Robust control; Robust stability; Space vector pulse width modulation; Stress; Voltage control;
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-4943-1
DOI :
10.1109/IAS.1998.730354