• DocumentCode
    2344591
  • Title

    Towards a tool for implementing delay-free ECC in embedded memories

  • Author

    Bonnoit, Thierry ; Nicolaidis, Michael ; Zergainoh, Nacer-Eddine

  • Author_Institution
    TIMA Lab., UJF, Grenoble, France
  • fYear
    2011
  • fDate
    9-12 Oct. 2011
  • Firstpage
    441
  • Lastpage
    442
  • Abstract
    The reliability of modern Integrated Circuits is affected by nanometric scaling. In many modern designs embedded memories occupy the largest part of the die and are designed as tight as allowed by the process. So they are more prone to failures than other circuits. Error correcting codes (ECC) are a convenient mean for protecting memories against failures. A major drawback of ECC is the speed penalty induced by the encoding and decoding circuits. In [5], we propose an architecture eliminating ECC delays in both read and write paths. However, this previous work does not describe a generic set of rules enabling inserting the delay-free ECC in any design. In this paper, we present the key points of an algorithm and a related tool automating its implementation.
  • Keywords
    SRAM chips; error correction codes; integrated circuit design; integrated circuit reliability; SRAM; delay-free ECC; embedded memories; embedded memory design; encoding-decoding circuits; error correcting codes; integrated circuit reliability; nanometric scaling; speed penalty; Algorithm design and analysis; Clocks; Decontamination; Delay; Error correction codes; Flip-flops; Program processors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2011 IEEE 29th International Conference on
  • Conference_Location
    Amherst, MA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4577-1953-0
  • Type

    conf

  • DOI
    10.1109/ICCD.2011.6081440
  • Filename
    6081440