DocumentCode
2344591
Title
Towards a tool for implementing delay-free ECC in embedded memories
Author
Bonnoit, Thierry ; Nicolaidis, Michael ; Zergainoh, Nacer-Eddine
Author_Institution
TIMA Lab., UJF, Grenoble, France
fYear
2011
fDate
9-12 Oct. 2011
Firstpage
441
Lastpage
442
Abstract
The reliability of modern Integrated Circuits is affected by nanometric scaling. In many modern designs embedded memories occupy the largest part of the die and are designed as tight as allowed by the process. So they are more prone to failures than other circuits. Error correcting codes (ECC) are a convenient mean for protecting memories against failures. A major drawback of ECC is the speed penalty induced by the encoding and decoding circuits. In [5], we propose an architecture eliminating ECC delays in both read and write paths. However, this previous work does not describe a generic set of rules enabling inserting the delay-free ECC in any design. In this paper, we present the key points of an algorithm and a related tool automating its implementation.
Keywords
SRAM chips; error correction codes; integrated circuit design; integrated circuit reliability; SRAM; delay-free ECC; embedded memories; embedded memory design; encoding-decoding circuits; error correcting codes; integrated circuit reliability; nanometric scaling; speed penalty; Algorithm design and analysis; Clocks; Decontamination; Delay; Error correction codes; Flip-flops; Program processors;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design (ICCD), 2011 IEEE 29th International Conference on
Conference_Location
Amherst, MA
ISSN
1063-6404
Print_ISBN
978-1-4577-1953-0
Type
conf
DOI
10.1109/ICCD.2011.6081440
Filename
6081440
Link To Document