DocumentCode :
2344650
Title :
Comparative analysis of copper and CNT interconnects for H-tree clock distribution
Author :
Ganti, Vish ; Mahmoodi, Hamid
fYear :
2011
fDate :
9-12 Oct. 2011
Firstpage :
447
Lastpage :
448
Abstract :
Clock distribution network is an important part of digital integrated circuits. The clock signal carried by the distribution network has to reach every end node at the same time to ensure synchronized switching. Due to mismatches among different nodes of the H-tree, the clock transitions among the final nodes of the distribution tree show some time difference, the maximum of which is called clock skew. In modern CMOS technologies, copper interconnect is popular for high level interconnects such as clock and power routing. Carbon Nanotube (CNT) exhibits less resistivity than copper making it a better material for interconnect. This paper compares the impact on clock skew of H-tree clock distribution network by replacing the traditional copper interconnects with carbon nanotube interconnects. By applying temperature mismatch, threshold voltage mismatch, and process mismatch, our findings show that using carbon nanotube interconnects reduces the clock skew significantly compared to traditional copper interconnects.
Keywords :
CMOS digital integrated circuits; carbon nanotubes; clock distribution networks; copper; integrated circuit interconnections; CMOS technologies; CNT interconnects; H-tree clock distribution network; carbon nanotube; clock skew; clock transitions; comparative analysis; copper interconnects; digital integrated circuits; high-level interconnects; process mismatch; switching synchronization; temperature mismatch; threshold voltage mismatch; Clocks; Contact resistance; Copper; Integrated circuit interconnections; Power demand; Synchronization; Threshold voltage; Carbon Nanotube; Clock Distribution Network; Clock Skew reduction; H-tree; Interconnects; global clock tree;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design (ICCD), 2011 IEEE 29th International Conference on
Conference_Location :
Amherst, MA
ISSN :
1063-6404
Print_ISBN :
978-1-4577-1953-0
Type :
conf
DOI :
10.1109/ICCD.2011.6081443
Filename :
6081443
Link To Document :
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