DocumentCode

2344958

Title

An Intelligent Vision System for Inspection of SMDS

Author

Teoh, E.K. ; Mital, D.P. ; Lee, B.W. ; Wee, L.K.

Author_Institution

Nanyang Technological University

fYear

1992

fDate

11-14 Aug 1992

Firstpage

598

Lastpage

602

Keywords

Fault detection; Frequency; Histograms; Inspection; Intelligent systems; Machine vision; Soldering; Strips; Surface-mount technology; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Emerging Technologies and Factory Automation, 1992. IEEE International Workshop on

Print_ISBN

0-7803-0886-7

Type

conf

DOI

10.1109/ETFA.1992.683322

Filename

683322