Title :
Design of Bayesian standard fixed duration test plans under exponential distribution
Author :
Shi Zhong ; Kuang Zhi-li
Author_Institution :
Dept. of Reliability & Environ., CEPREI, Guangzhou, China
Abstract :
According to the product with the exponential distribution, design features of classical standard fixed duration test plans in actual engineering is studied and summarized, this paper discusses mathematical method of designing Bayesian standard fixed duration test plans.
Keywords :
Bayes methods; exponential distribution; reliability theory; statistical testing; Bayesian standard fixed duration test plan; exponential distribution; mathematical method; reliability theory; Bayesian methods; Clocks; Design engineering; Design methodology; Exponential distribution; Probability; Reliability engineering; Statistical analysis; Statistical distributions; Testing; Bayes method; fixed duration; reliability; test plans;
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
DOI :
10.1109/ICIEA.2009.5138956
