• DocumentCode
    2345695
  • Title

    Exposure-resilient extractors

  • Author

    Zimand, Marius

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Towson Univ., Baltimore, MD
  • fYear
    0
  • fDate
    0-0 0
  • Lastpage
    72
  • Abstract
    An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string being tested. More precisely, EXT : {0, 1}n times {0, 1}d rarr {0, 1}m is a (k, epsi)-exposure resilient extractor resistant to q queries if, when the min-entropy of x is at least k and y is random, EXT(x, y) looks epsi-random to all statistical tests modeled by oracle circuits of unbounded complexity that can query q bits of x. We construct, for any delta < 1, a(k, epsi)-exposure resilient extractor with query resistance ndelta, k = n - nOmega(1), epsi = n-Omega(1), m = nOmega(1) and d = O(log n)
  • Keywords
    computational complexity; minimum entropy methods; statistical analysis; exposure-resilient extractors; imperfect min-entropy; oracle circuits; random variable; unbounded complexity; Circuit testing; Cryptographic protocols; Cryptography; Data mining; Random variables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Complexity, 2006. CCC 2006. Twenty-First Annual IEEE Conference on
  • Conference_Location
    Prague
  • ISSN
    1093-0159
  • Print_ISBN
    0-7695-2596-2
  • Type

    conf

  • DOI
    10.1109/CCC.2006.19
  • Filename
    1663726