DocumentCode
2345695
Title
Exposure-resilient extractors
Author
Zimand, Marius
Author_Institution
Dept. of Comput. & Inf. Sci., Towson Univ., Baltimore, MD
fYear
0
fDate
0-0 0
Lastpage
72
Abstract
An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string being tested. More precisely, EXT : {0, 1}n times {0, 1}d rarr {0, 1}m is a (k, epsi)-exposure resilient extractor resistant to q queries if, when the min-entropy of x is at least k and y is random, EXT(x, y) looks epsi-random to all statistical tests modeled by oracle circuits of unbounded complexity that can query q bits of x. We construct, for any delta < 1, a(k, epsi)-exposure resilient extractor with query resistance ndelta, k = n - nOmega(1), epsi = n-Omega(1), m = nOmega(1) and d = O(log n)
Keywords
computational complexity; minimum entropy methods; statistical analysis; exposure-resilient extractors; imperfect min-entropy; oracle circuits; random variable; unbounded complexity; Circuit testing; Cryptographic protocols; Cryptography; Data mining; Random variables;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Complexity, 2006. CCC 2006. Twenty-First Annual IEEE Conference on
Conference_Location
Prague
ISSN
1093-0159
Print_ISBN
0-7695-2596-2
Type
conf
DOI
10.1109/CCC.2006.19
Filename
1663726
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