Title :
EEG-Based Emotion Recognition Using Statistical Measures and Auto-Regressive Modeling
Author :
Vijayan, Aravind E. ; Sen, Deepak ; Sudheer, A.P.
Author_Institution :
Mechatron./Robot. Lab., Nat. Inst. of Technol. Calicut, Calicut, India
Abstract :
In this paper, a novel approach towards classification of various human emotions based on statistically weighed autoregressive modeling of Electroencephalogram (EEG) signals is discussed. The proposed algorithm was proven to be superior to many related works, in distinguishing different emotions such as happiness, fear, sadness etc. The findings discussed are based on the results obtained using benchmark emotion based EEG database called DEAP. In this work, epochs were extracted from data using statistical measures such as Shannon Entropy and higher order auto-regressive model was fit to the extracted features. The model was used for classifying human emotions by feeding it into a multi-class Support Vector Machine (MCSVM). The proposed algorithm is proven to be more efficient than existing algorithms as a classification accuracy of 94.097% was obtained.
Keywords :
electroencephalography; emotion recognition; feature extraction; higher order statistics; medical signal processing; support vector machines; DEAP; EEG-based emotion recognition; MCSVM; Shannon entropy; benchmark emotion based EEG database; electroencephalogram signals; feature extraction; higher order autoregressive model; multiclass support vector machine; statistically weighed autoregressive modeling; Accuracy; Brain modeling; Electroencephalography; Emotion recognition; Entropy; Feature extraction; Signal processing algorithms; Auto-regression; EEG; Multi Class SVM; Shannon Entropy;
Conference_Titel :
Computational Intelligence & Communication Technology (CICT), 2015 IEEE International Conference on
Conference_Location :
Ghaziabad
Print_ISBN :
978-1-4799-6022-4
DOI :
10.1109/CICT.2015.24