• DocumentCode
    2345795
  • Title

    Improvable Deflate Algorithm

  • Author

    Weimin, Wu ; Huijiang, Guo ; Yi, Hu ; Jingbao, Fan ; Huan, Wang

  • Author_Institution
    Fac. of Comput., Guangdong Univ. of Technol., Guangzhou
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    1572
  • Lastpage
    1574
  • Abstract
    The Improvable Deflate Algorithm proposed in this paper has a certain improvement based on the previous Deflate Algorithm. In our algorithm, the first step is to implement LZ77 algorithm, the second step is the dynamic or static Huffman encoding. As LZ77 is to operate the bit of the data and change the original character of the byte, we replace the dynamic or static Huffman encoding with active Markov Chain. Dynamic Markov Chain is united by 2 bits of the binary system whose input can only be 01, 01, 10 or 11, which can simplifies and lowers the risk of memory overflow in the status space due to tThe Improvable Deflate Algorithm proposed in this paper has a certain improvement based on the previous Deflate Algorithm. In our algorithm, the first step is to implement LZ77 algorithm, the second step is the dynamic or static Huffman encoding. As LZ77 is to operate the bit of the data and change the original character of the byte, we replace the dynamic or static Huffman encoding with active Markov Chain. Dynamic Markov Chain is united by 2 bits of the binary system whose input can only be 01, 01, 10 or 11, which can simplifies and lowers the risk of memory overflow in the status space due to the rapid increase of the data.he rapid increase of the data.
  • Keywords
    Huffman codes; Markov processes; LZ77 algorithm; active Markov chain; binary system; dynamic Huffman encoding; dynamic Markov chain; improvable deflate algorithm; static Huffman encoding; Binary trees; Compression algorithms; Data compression; Dictionaries; Encoding; Entropy; Floods; Huffman coding; Jacobian matrices; Probability; Deflate; Huffman; LZ77; Markov; Status Space;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582783
  • Filename
    4582783