• DocumentCode
    2346562
  • Title

    Wavelength and threshold current stabilization of an uncooled diode laser, using thermal stress

  • Author

    Cohen, Daniel A. ; Coldren, Larry A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1996
  • fDate
    13-18 Oct. 1996
  • Firstpage
    135
  • Lastpage
    136
  • Abstract
    We show that strain from differential thermal expansion may be used to stabilize the wavelength and threshold current of an uncooled GaInAs/InP laser, and demonstrate a 50% reduction in wavelength drift, using a thermal-stress-engineered package.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; laser frequency stability; semiconductor device testing; semiconductor lasers; thermal expansion; thermal stresses; GaInAs-InP; GaInAs/InP laser; differential thermal expansion; strain; thermal stress; thermal-stress-engineered package; threshold current; threshold current stabilization; uncooled diode laser; wavelength drift; wavelength stabilization; Capacitive sensors; Diode lasers; Laser stability; Lenses; Packaging; Temperature sensors; Thermal engineering; Thermal expansion; Thermal stresses; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Laser Conference, 1996., 15th IEEE International
  • Conference_Location
    Haifa, Israel
  • Print_ISBN
    0-7803-3163-X
  • Type

    conf

  • DOI
    10.1109/ISLC.1996.558763
  • Filename
    558763