Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection

Author

Hu, Yingsong ; Xi, Jiangtao ; Chicharo, Joe ; Yang, Zongkai

Author_Institution

Sch. of Electr. Comput. & Telecommun. Eng., Wollongong Univ., NSW

fYear

2006

fDate

26-28 July 2006

Firstpage

161

Lastpage

167

Abstract

In this paper, an improved method for three-step phase shifting profilometry (PSP) is presented to eliminate the errors introduced by the second order harmonic when digital projection are used to generate fringe patterns. Firstly, the error caused by the second order harmonic is theoretically analyzed. Then based on the error analysis and principle of PSP, we propose a novel approach, called improved three-step phase shifting profilometry (I3PSP), to eliminate the influence of the second order harmonic. Finally, simulations are performed to verify the effectiveness of the proposed I3PSP, which demonstrate that the reconstruction accuracy of using three-step PSP has been significantly improved by the proposed I3PSP

Keywords

error analysis; optical harmonic generation; phase shifting interferometry; surface topography measurement; digital fringe pattern projection; error analysis; second order harmonic; three-dimensional reconstruction; three-step phase shifting profilometry; Band pass filters; Computer errors; Digital filters; Error analysis; Gratings; Image reconstruction; Pattern analysis; Phase locked loops; Power harmonic filters; Surface reconstruction;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Graphics, Imaging and Visualisation, 2006 International Conference on

Conference_Location

Sydney, Qld.

Print_ISBN

0-7695-2606-3

Type

conf

DOI

10.1109/CGIV.2006.58

Filename

1663784