DocumentCode :
2346668
Title :
Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection
Author :
Hu, Yingsong ; Xi, Jiangtao ; Chicharo, Joe ; Yang, Zongkai
Author_Institution :
Sch. of Electr. Comput. & Telecommun. Eng., Wollongong Univ., NSW
fYear :
2006
fDate :
26-28 July 2006
Firstpage :
161
Lastpage :
167
Abstract :
In this paper, an improved method for three-step phase shifting profilometry (PSP) is presented to eliminate the errors introduced by the second order harmonic when digital projection are used to generate fringe patterns. Firstly, the error caused by the second order harmonic is theoretically analyzed. Then based on the error analysis and principle of PSP, we propose a novel approach, called improved three-step phase shifting profilometry (I3PSP), to eliminate the influence of the second order harmonic. Finally, simulations are performed to verify the effectiveness of the proposed I3PSP, which demonstrate that the reconstruction accuracy of using three-step PSP has been significantly improved by the proposed I3PSP
Keywords :
error analysis; optical harmonic generation; phase shifting interferometry; surface topography measurement; digital fringe pattern projection; error analysis; second order harmonic; three-dimensional reconstruction; three-step phase shifting profilometry; Band pass filters; Computer errors; Digital filters; Error analysis; Gratings; Image reconstruction; Pattern analysis; Phase locked loops; Power harmonic filters; Surface reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Graphics, Imaging and Visualisation, 2006 International Conference on
Conference_Location :
Sydney, Qld.
Print_ISBN :
0-7695-2606-3
Type :
conf
DOI :
10.1109/CGIV.2006.58
Filename :
1663784
Link To Document :
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