Title :
A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles
Author :
Hafed, Mohamed M. ; Roberts, Gordon W.
Author_Institution :
DFT MicroSystems Inc., Montreal, Que., Canada
Abstract :
An integrated circuit uses a 0.18 μm CMOS process and contains five 10-GHz effective sampling rate analog-tester/oscilloscope cores. Each core consists of a memory, two samplers, and a voltage comparator. It can perform coherent DSP-based testing of mixed-signal macros and transient measurement for signal integrity evaluation. Each such core supports a variable resolution of up to 9-b. Test vehicles, such as a tuned amplifier, on-chip interconnect, and digital noise generators, are measured using the cores.
Keywords :
CMOS integrated circuits; amplifiers; integrated circuit interconnections; integrated circuit testing; mixed analogue-digital integrated circuits; noise generators; oscilloscopes; signal resolution; signal sampling; test equipment; transient analysis; 0.18 micron; 10 GHz; CMOS process; analog tester/oscilloscope cores; coherent DSP-based testing; core memory; digital noise generators; effective sampling rate; mixed-signal macros; on-chip interconnect; samplers; signal integrity evaluation; test vehicles; transient measurement; tuned amplifier; variable resolution sampling rate coherent tester/oscilloscope IC; voltage comparator; Analog integrated circuits; CMOS analog integrated circuits; CMOS integrated circuits; CMOS process; Circuit testing; Integrated circuit testing; Oscilloscopes; Sampling methods; Signal sampling; Vehicles;
Conference_Titel :
Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003
Print_ISBN :
0-7803-7842-3
DOI :
10.1109/CICC.2003.1249473
