Title :
Image registration by integrating similarity and epipolor constraints
Author :
He, Mingyi ; Dai, Yuchao ; Zhang, Jing
Author_Institution :
Sch. of Electron. & Inf., Northwestern Polytech. Univ., Xi´´an
Abstract :
Accurate image registration plays an important role in computer vision, three-dimensional information acquisition and remote sensing processing. Recent researches on image registration are mostly focused on those by using either epipolar geometry or feature extraction, restricting the performance of image registration. A novel algorithm integrating similarity constraint and epipolar constraint is proposed in this paper. This algorithm firstly realizes the similarity constraint utilizing the Harris-Laplace detector combined with the SIFT (Scale Invariant Feature Transform) descriptor. Then, new approach of two-way epipolar constraint is proposed and used in the following processing, which satisfies the epipolar constraint and uniqueness constraint simultaneously. Thirdly, the iteration process is conducted until all constraints are satisfied. Additionally, a generalized algorithm for the situation without localization information of the image acquisition is given. The algorithm is examined through extensive experiments on various images from video sequence to digital camera images and the results show that the proposed algorithm exceeds SIFT in the aspect of match accuracy at the cost of a little more time consume.
Keywords :
Laplace transforms; feature extraction; image matching; image registration; image sequences; iterative methods; video signal processing; Harris-Laplace detector; SIFT; digital camera images; epipolar geometry; epipolor constraints; feature extraction; image acquisition; image registration; iteration process; localization information; scale invariant feature transform descriptor; similarity constraints; two-way epipolar constraint; video sequence; Computer vision; Detectors; Feature extraction; Geometry; Helium; Image registration; Laboratories; Layout; Remote sensing; Video sequences;
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
DOI :
10.1109/ICIEA.2008.4582844