Title :
Statistics for matching
Author :
Pergoot, A. ; Graindourze, B. ; Janssens, E.R. ; Bastos, J. ; Steyaert, M. ; Kinget, P. ; Roovers, R. ; Sansen, W.
Author_Institution :
Alcatel Mietec, Oudenaarde, Belgium
Abstract :
A statistical approach for evaluating the stochastic mismatching between two identically designed elements on the same chip is discussed. An approach to determine accurate matching parameters for a specific pair of devices and to obtain realistic worst case parameters for the area dependency model is presented. The approach is demonstrated by applying it to measured transistor threshold voltage mismatching data for a 0.7 μm CMOS technology
Keywords :
CMOS integrated circuits; integrated circuit modelling; statistical analysis; stochastic processes; 0.7 micron; CMOS technology; area dependency model; matching statistics; stochastic mismatching; transistor threshold voltage; CMOS technology; Gaussian distribution; MOSFETs; Resistors; Sampling methods; Statistical analysis; Statistical distributions; Statistics; Testing; Threshold voltage;
Conference_Titel :
Microelectronic Test Structures, 1995. ICMTS 1995. Proceedings of the 1995 International Conference on
Conference_Location :
Nara
Print_ISBN :
0-7803-2065-4
DOI :
10.1109/ICMTS.1995.513971
