• DocumentCode
    2347001
  • Title

    Statistics for matching

  • Author

    Pergoot, A. ; Graindourze, B. ; Janssens, E.R. ; Bastos, J. ; Steyaert, M. ; Kinget, P. ; Roovers, R. ; Sansen, W.

  • Author_Institution
    Alcatel Mietec, Oudenaarde, Belgium
  • fYear
    1995
  • fDate
    22-25 Mar 1995
  • Firstpage
    193
  • Lastpage
    197
  • Abstract
    A statistical approach for evaluating the stochastic mismatching between two identically designed elements on the same chip is discussed. An approach to determine accurate matching parameters for a specific pair of devices and to obtain realistic worst case parameters for the area dependency model is presented. The approach is demonstrated by applying it to measured transistor threshold voltage mismatching data for a 0.7 μm CMOS technology
  • Keywords
    CMOS integrated circuits; integrated circuit modelling; statistical analysis; stochastic processes; 0.7 micron; CMOS technology; area dependency model; matching statistics; stochastic mismatching; transistor threshold voltage; CMOS technology; Gaussian distribution; MOSFETs; Resistors; Sampling methods; Statistical analysis; Statistical distributions; Statistics; Testing; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1995. ICMTS 1995. Proceedings of the 1995 International Conference on
  • Conference_Location
    Nara
  • Print_ISBN
    0-7803-2065-4
  • Type

    conf

  • DOI
    10.1109/ICMTS.1995.513971
  • Filename
    513971
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2347001