Title :
High temperature growth of SiC and group III nitride structures in production reactors
Author :
Schmitz, D. ; Beccard, R. ; Woelk, E.G. ; Strauch, G. ; Juergensen, H.
Author_Institution :
AXITRON AG, Aachen, Germany
Abstract :
We describe the use of a family of high temperature MOVPE reactors to grow SiC and III-V nitrides such as GaN. The load capacity ranges from single wafer machines to multiple wafer mass production reactors. All of these reactors have a two flow injection system, allowing separated inlet of the various reactants. To achieve maximum growth uniformity, the Gas Foil RotationR principle is applied. The multiwafer reactors are planetary reactors with a double rotation of substrates. Extensive modeling has been used in order to find the optimum reactor geometries. An optimization of uniformity and efficiency and a minimization of undesired parasitic reactions has thus been obtained
Keywords :
III-V semiconductors; MOCVD; gallium compounds; high-temperature techniques; optimisation; semiconductor growth; semiconductor process modelling; silicon compounds; vapour phase epitaxial growth; wide band gap semiconductors; GaN; GaN high temperature growth; Gas Foil Rotation principle; III-V nitrides; SiC; SiC high temperature growth; double substrate rotation; efficiency optimization; group III nitride structure high temperature growth; growth uniformity; high temperature MOVPE reactors; high temperature growth; load capacity; modeling; multiple wafer mass production reactors; multiwafer reactors; optimum reactor geometries; planetary reactors; production reactors; separated reactant inlet; single wafer machines; two flow injection system; undesired parasitic reaction minimization; uniformity optimization; Epitaxial growth; Epitaxial layers; Gallium nitride; Geometry; III-V semiconductor materials; Inductors; Mass production; Silicon carbide; Solid modeling; Temperature;
Conference_Titel :
High-Temperature Electronic Materials, Devices and Sensors Conference, 1998
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4437-5
DOI :
10.1109/HTEMDS.1998.730688