• DocumentCode
    2347059
  • Title

    High temperature growth of SiC and group III nitride structures in production reactors

  • Author

    Schmitz, D. ; Beccard, R. ; Woelk, E.G. ; Strauch, G. ; Juergensen, H.

  • Author_Institution
    AXITRON AG, Aachen, Germany
  • fYear
    1998
  • fDate
    22-27 Feb 1998
  • Firstpage
    132
  • Lastpage
    135
  • Abstract
    We describe the use of a family of high temperature MOVPE reactors to grow SiC and III-V nitrides such as GaN. The load capacity ranges from single wafer machines to multiple wafer mass production reactors. All of these reactors have a two flow injection system, allowing separated inlet of the various reactants. To achieve maximum growth uniformity, the Gas Foil RotationR principle is applied. The multiwafer reactors are planetary reactors with a double rotation of substrates. Extensive modeling has been used in order to find the optimum reactor geometries. An optimization of uniformity and efficiency and a minimization of undesired parasitic reactions has thus been obtained
  • Keywords
    III-V semiconductors; MOCVD; gallium compounds; high-temperature techniques; optimisation; semiconductor growth; semiconductor process modelling; silicon compounds; vapour phase epitaxial growth; wide band gap semiconductors; GaN; GaN high temperature growth; Gas Foil Rotation principle; III-V nitrides; SiC; SiC high temperature growth; double substrate rotation; efficiency optimization; group III nitride structure high temperature growth; growth uniformity; high temperature MOVPE reactors; high temperature growth; load capacity; modeling; multiple wafer mass production reactors; multiwafer reactors; optimum reactor geometries; planetary reactors; production reactors; separated reactant inlet; single wafer machines; two flow injection system; undesired parasitic reaction minimization; uniformity optimization; Epitaxial growth; Epitaxial layers; Gallium nitride; Geometry; III-V semiconductor materials; Inductors; Mass production; Silicon carbide; Solid modeling; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Temperature Electronic Materials, Devices and Sensors Conference, 1998
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-4437-5
  • Type

    conf

  • DOI
    10.1109/HTEMDS.1998.730688
  • Filename
    730688