Title :
Theoretical study of stubs for power line noise reduction [LSI applications]
Author :
Nakura, Torn ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
Dept. of Electron. Eng., Univ. of Tokyo, Japan
Abstract :
This paper describes a di/dt noise reduction method, which attaches stubs to the power line in LSI chips. A theoretical model of a lossy transmission line stub is investigated, and simulation results show that the stub can reduce 48% and 26% of the noise compared with the non stub-attached case, and de-coupling capacitor case, respectively, in a 2.5 GHz 1.8 V operation test circuit. It is also shown that this method will work more efficiently for further high frequency operation chips.
Keywords :
electromagnetic interference; integrated circuit noise; interference suppression; large scale integration; transmission line theory; 1.8 V; 2.5 GHz; EMI noise; LSI power line stubs; de-coupling capacitor; di/dt noise reduction method; high frequency operation chips; lossy transmission line stub; power line noise reduction; Capacitors; Circuit noise; Circuit simulation; Circuit testing; Distributed parameter circuits; Large scale integration; Noise reduction; Power transmission lines; Propagation losses; Transmission line theory;
Conference_Titel :
Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003
Print_ISBN :
0-7803-7842-3
DOI :
10.1109/CICC.2003.1249493
