DocumentCode :
2347177
Title :
Estimating Reflectance Parameters of an Object from Saturated Spectral Images
Author :
Li, Shiying ; Manabe, Yoshitsugu ; Chihara, Kunihiro
Author_Institution :
Image Process. Lab., Nara Inst. of Sci. & Technol.
fYear :
2006
fDate :
26-28 July 2006
Firstpage :
335
Lastpage :
340
Abstract :
A method is described to reproduce reflection properties at the surface of real objects using spectral images, which are often saturated because of the limited dynamic range of image detectors. Reflection components are separated into diffuse and specular reflection components based on the dichromatic model at 5-nm wavelength intervals between 380 nm and 780 nm for each pixel of the spectral images, and diffuse reflectance parameters are estimated during the separation. To estimate specular reflectance parameters, the Gaussian distribution function of the Torrance-Sparrow reflection model is transformed logarithmically to a linear form, and the unsaturated values of the specular reflection components are subjected to the least squares method. Experimental results with a real object demonstrate the efficiency of the proposed method
Keywords :
Gaussian distribution; computer vision; image colour analysis; least squares approximations; object detection; reflectivity; Gaussian distribution function; Torrance-Sparrow reflection model; image detector; least squares method; object detection; saturated spectral image; Character generation; Computer graphics; Detectors; Dynamic range; Image reconstruction; Least squares methods; Optical reflection; Parameter estimation; Polarization; Reflectivity; Reflectance parameters; color; reproduction; spectral images; specular reflection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Graphics, Imaging and Visualisation, 2006 International Conference on
Conference_Location :
Sydney, Qld.
Print_ISBN :
0-7695-2606-3
Type :
conf
DOI :
10.1109/CGIV.2006.40
Filename :
1663813
Link To Document :
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