• DocumentCode
    2347205
  • Title

    Self-calibration of ultrasonic transducers in an intelligent data acquisition system

  • Author

    Papageorgiou, Chris ; Laopoulos, Theodore

  • Author_Institution
    Electron. Lab. Phys. Dept., Aristotle Univ. of Thessaloniki
  • fYear
    2003
  • fDate
    8-10 Sept. 2003
  • Firstpage
    2
  • Lastpage
    6
  • Abstract
    The rapid growth of powerful single-chip microcomputers for monitoring and data acquisition applications permits nowadays the design of advanced measuring systems. We present an advanced on-line monitoring configuration in order to improve the performance and extend the lifetime of ultrasonic transducers by applying an automated testing and calibration technique. The operation of this instrumentation system is based on the fast measurement of frequency and amplitude, performed by the proposed configuration. The combination of this information with the time of flight of each pulse-train is then used to derive practically all characteristics of ultrasonic transducers. Due to its low cost and small size, the system can be used either for characterization and classification of transducers, or as a self-testing and automated calibration section within any high performance ultrasonic system
  • Keywords
    automatic testing; calibration; computerised instrumentation; data acquisition; measurement systems; microcontrollers; ultrasonic transducers; DSP microcontrollers; intelligent data acquisition system; on-line monitoring configuration; single-chip microcomputers; transducer characterization; ultrasonic transducer self-calibration; ultrasonic transducer self-testing; Automatic testing; Calibration; Computerized monitoring; Data acquisition; Instruments; Intelligent systems; Life testing; Microcomputers; Ultrasonic transducers; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on
  • Conference_Location
    Lviv
  • Print_ISBN
    0-7803-8138-6
  • Type

    conf

  • DOI
    10.1109/IDAACS.2003.1249504
  • Filename
    1249504