DocumentCode :
2347229
Title :
Reliability concerns in high temperature electronic systems
Author :
McCluskey, Patrick ; Grybowski, R.R. ; Condra, Lloyd ; Das, Diganta ; Fink, John ; Jordan, Jill ; Torri, Tom
Author_Institution :
CALCE Electron. Products & Syst. Consortium, Maryland Univ., College Park, MD, USA
fYear :
1998
fDate :
22-27 Feb 1998
Firstpage :
199
Lastpage :
206
Abstract :
Small signal commercial electronics have traditionally been designed to operate at temperatures below 125°C. This has become a severe constraint in the development of next generation smart power electronic systems, such as remote actuators, point-of-use power supplies, and distributed high power control systems. These systems dissipate considerable heat and can operate in environments where the local ambient temperatures reach 200°C. The ability to operate these systems without the need for active cooling is seen as a critical technology for the 21st century. The issues involved in designing silicon-based electronic systems for use at temperatures as high as 200°C are presented in this work. The critical limiting components and packaging materials have been identified through design analyses conducted on commercially available aeronautic and automotive control modules. It is found that most standard components and packaging elements can be used up to 200°C. However, capacitors, wire bonds, eutectic tin-lead solder joints, and FR-4 boards seriously degrade at temperatures around 200°C. For these elements, alternative choices are recommended
Keywords :
aerospace instrumentation; automotive electronics; capacitors; cooling; electric control equipment; elemental semiconductors; high-temperature electronics; integrated circuit reliability; integrated circuit testing; laminates; lead bonding; modules; power integrated circuits; printed circuits; silicon; soldering; thermal management (packaging); 125 C; 200 C; FR-4 boards; Si; SnPb; active cooling; aeronautic control modules; automotive control modules; capacitors; critical limiting components; critical limiting packaging materials; design analyses; distributed high power control systems; eutectic tin-lead solder joints; heat dissipation; high temperature electronic systems; local ambient temperature; operating environments; operating temperature; point-of-use power supplies; reliability; remote actuators; silicon-based electronic systems design; small signal commercial electronics; smart power electronic systems; standard components; standard packaging elements; thermal degradation; wire bonds; Conducting materials; Electronics cooling; Electronics packaging; Intelligent actuators; Power control; Power electronics; Power supplies; Power system reliability; Signal design; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Temperature Electronic Materials, Devices and Sensors Conference, 1998
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4437-5
Type :
conf
DOI :
10.1109/HTEMDS.1998.730698
Filename :
730698
Link To Document :
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