• DocumentCode
    2347365
  • Title

    Author index

  • fYear
    1995
  • fDate
    22-25 March 1995
  • Firstpage
    303
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1995. ICMTS 1995. Proceedings of the 1995 International Conference on
  • Conference_Location
    Nara, Japan
  • Print_ISBN
    0-7803-2065-4
  • Type

    conf

  • DOI
    10.1109/ICMTS.1995.513992
  • Filename
    513992
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2347365