Title :
CMOS Integrated Circuit with Improved Temperature Behavior Based on a Temperature Optimized Auto-Programmable Loop
Author_Institution :
Univ. Politehnica of Bucharest, Bucharest
Abstract :
A new auto-programmable superior-order curvature-corrected integrated nanostructure will be presented, based on the compensation of the gate-source voltage temperature nonlinearity by a suitable biasing of a MOS transistor at a PTATalpha current. In order to maximize the temperature behavior of the system, a thermal stabilization circuit and an auto-programmable loop will be designed to select the optimal values for the chip temperature T0 and for the value of parameter alpha (equivalent to select the optimal type of the curvature-correction technique). Because these optimal values of alpha and T0 are determined using a previous stored data basis referring to the nanostructure circuit behavior, the errors caused by the finite precision of parameters determination will be cancel out.
Keywords :
CMOS integrated circuits; MOSFET; nanostructured materials; thermal stability; CMOS integrated circuit; MOS transistor; autoprogrammable superior-order curvature-corrected integrated nanostructure; gate-source voltage temperature nonlinearity; nanostructure circuit behavior; temperature optimized autoprogrammable loop; thermal stabilization circuit; CMOS integrated circuits; Information technology; Integrated circuit technology; MOS devices; MOSFETs; Nanoscale devices; Telecommunication computing; Temperature; Very large scale integration; Voltage; Temperature dependence; auto-programmable loop; superior-order curvature-correction techniques;
Conference_Titel :
EUROCON, 2007. The International Conference on "Computer as a Tool"
Conference_Location :
Warsaw
Print_ISBN :
978-1-4244-0813-9
Electronic_ISBN :
978-1-4244-0813-9
DOI :
10.1109/EURCON.2007.4400244