Title :
Evaluation of reliability characteristics for ramified computing systems
Author_Institution :
Lviv Polytech. Nat. Univ.
Abstract :
Main reliability characteristics of unrestorable symmetric computing systems ramified to level 2 and with ageing ramified elements are examined. Expressions for the failure probability, the failure frequency and the failure rate are worked out in the cases when the reliability of ageing output elements is circumscribed by the Rayleigh distribution or by the Weibull distribution
Keywords :
Weibull distribution; failure analysis; reliability theory; Rayleigh distribution; Weibull distribution; ageing element; failure frequency; failure probability; failure rate; reliability characteristic; unrestorable symmetric ramified computing system; Aging; Control charts; Distributed computing; Equations; Exponential distribution; Frequency; Hazards; Reliability theory; Shape; Weibull distribution;
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on
Conference_Location :
Lviv
Print_ISBN :
0-7803-8138-6
DOI :
10.1109/IDAACS.2003.1249522
