Title :
Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232)
Abstract :
The following topics were dealt with: current-based testing; functional testing; test compaction; bridging faults; BICS; transient testing; signature analysis; mixed signal testing; and deep submicron testing
Keywords :
CMOS integrated circuits; ULSI; built-in self test; fault diagnosis; integrated circuit testing; leakage currents; mixed analogue-digital integrated circuits; transient analysis; BICS; IDDQ testing; bridging faults; current-based testing; deep submicron testing; functional testing; mixed signal testing; signature analysis; test compaction; transient testing;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730723
