Title :
Test input generation for supply current testing of bridging faults in bipolar combinational logic circuits
Author :
Kuchii, Toshimasa ; Hashizume, Masaki ; Tamesada, Takeomi
Author_Institution :
Fac. of Eng., Tokushima Univ., Japan
Abstract :
A test input generation algorithm for supply current tests is proposed to detect bridging faults in bipolar combinational circuits. By using the algorithm, test input vectors are derived for ISCAS-85 benchmark circuits, which are implemented on printed boards. It is shown by the test generation that more faults in bipolar circuits can be detected with a smaller number of test input vectors than a conventional test method based on output logic values
Keywords :
bipolar logic circuits; combinational circuits; fault location; integrated circuit testing; logic testing; ISCAS-85 benchmark circuits; bipolar combinational logic circuits; bridging faults; supply current testing; test input generation; test input vectors; CMOS logic circuits; Circuit faults; Circuit testing; Combinational circuits; Current supplies; Electrical fault detection; Fault detection; Feedback; Logic circuits; Logic testing;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730726
