• DocumentCode
    2347791
  • Title

    Pose and illumination invariant 2D to 3D facial recognition system

  • Author

    Yang, Ukil ; Shin, Hyoungchul ; Sohn, Kwanghoon

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    2121
  • Lastpage
    2126
  • Abstract
    This paper proposes a pose and illumination invariant face recognition method based on a 2D to 3D facial recognition system which uses two dimensional (2D) image as an input and three dimensional (3D) data as a database. To improve the performance of a facial recognition system, we reorganize the framework of a conventional recognition system into more suitable framework for a 2D to 3D facial recognition system. 2D to 3D pose and illumination estimation algorithm is proposed based on a learning algorithm using multilayer perceptron (MLP). The proposed method estimates both pose and illumination factors of an input image in real-time, and compensates for a database in order to overcome the problems of pose and illumination without any occlusion occurred by insufficient information. To evaluate the performance, we performed both the accuracy tests of pose and illumination estimation and the recognition tests of 2D to 3D facial recognition system with a face database containing both two and three dimensional data.
  • Keywords
    face recognition; learning (artificial intelligence); lighting; multilayer perceptrons; pose estimation; 2D image; 3D data; face database; facial recognition system; illumination estimation; learning algorithm; multilayer perceptron; pose estimation; Biometrics; Cameras; Costs; Data engineering; Face recognition; Humans; Image databases; Lighting; Surveillance; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582894
  • Filename
    4582894