Title : 
Sparse random projection for efficient cancelable face feature extraction
         
        
            Author : 
Kim, Youngsung ; Toh, Kar-Ann
         
        
            Author_Institution : 
Biometrics Eng. Res. Center, Yonsei Univ., Seoul
         
        
        
        
        
        
            Abstract : 
Based on a recently proposed framework for cancelable biometric template generation, this paper focuses on boosting the computational efficiency using a sparse random projection. Comparing with a non-sparse random projection, we show empirically that the verification accuracy of templates generated by sparse random projection do not degrade while enjoying a more efficient feature extraction process than before. This work contributes to establishment of an algorithm for effective cancelable face template generation.
         
        
            Keywords : 
biometrics (access control); face recognition; feature extraction; random processes; cancelable face biometric template generation; cancelable face feature extraction; sparse random projection; Biometrics; Boosting; Computational efficiency; Data mining; Degradation; Eigenvalues and eigenfunctions; Face recognition; Feature extraction; Principal component analysis; Vectors;
         
        
        
        
            Conference_Titel : 
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
         
        
            Conference_Location : 
Singapore
         
        
            Print_ISBN : 
978-1-4244-1717-9
         
        
            Electronic_ISBN : 
978-1-4244-1718-6
         
        
        
            DOI : 
10.1109/ICIEA.2008.4582897