Title :
Clustering based identification of faulty ICs using IDDQ tests
Author :
Jandhyala, Sri ; Balachandran, Hari ; Menon, Sankaran ; Jayasumana, Anura
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Technological advances in design and process have led to questions being raised about the applicability of IDDQ testing. The main concern is the inability to differentiate between normal and faulty quiescent currents in ICs. In this paper, we propose a new methodology aimed at addressing this concern through the application of clustering techniques to identify ICs with abnormal IDDQ values. Preliminary results of applying this technique in production test are also presented
Keywords :
CMOS digital integrated circuits; fault diagnosis; integrated circuit testing; logic testing; production testing; CMOS; IDDQ tests; abnormal IDDQ values; clustering based identification; faulty ICs; logic testing; production test; quiescent currents; Application specific integrated circuits; CMOS integrated circuits; Condition monitoring; Fault detection; Fault diagnosis; Instruments; Leakage current; Logic devices; Logic testing; Process design;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730756
