Title :
Off chip monitors and built in current sensors for analogue and mixed signal testing
Author :
Maidon, Y. ; Deval, Y. ; Manhaeve, H.
Author_Institution :
Lab. de Microelectron. IXL, Bordeaux I Univ., France
Abstract :
The aim of this paper is to be part a general survey regarding test methods for analogue and mixed circuits, using a stimulus on the signal or power supply inputs. The data is extracted from the power supply current IDD. It is based on the fruitful measurement of the IDDQ, the DC power supply current, as well as the measurement of the IDDT, the transient power supply current. This paper presents the state of the art of the existing current monitors sorted according to their sensitive element
Keywords :
CMOS integrated circuits; analogue integrated circuits; built-in self test; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; CMOS; DC power supply current; IDDQ measurement; analogue testing; built in current sensors; mixed signal testing; off chip monitors; power supply inputs; sensitive element; transient power supply current; Circuit faults; Circuit testing; Current measurement; Current supplies; Data mining; Integrated circuit measurements; Power measurement; Power supplies; Read only memory; Signal to noise ratio;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730758
