Title :
6B-6 An Ultra Small SAW RF Filter using Wafer Level Packaging Technology
Author :
Lim, Ji-hyuk ; Hwang, Jun-sik ; Kwon, Jongoh ; Ham, Suk-jin ; Kim, Woonbae ; Kim, Tae Hoon ; Jeung, Won Kyu ; Yang, Si Joong ; Choi, Seog Moon ; Park, Jang Ho
Author_Institution :
Packaging Project Team, Samsung Adv. Inst. of Technol., Yongin
Abstract :
Since a multitude of surface acoustic wave (SAW) filters are the key components for wireless communications, they play an important role in today´s mobile phone evolution. Increasing the levels of functional integration and size reduction are therefore the major driving forces in recent SAW radio frequency (RF) filter development. This paper presents a pioneering work for design and fabrication of ultra small SAW filter package. A novel wafer level packaging technology based on through-wafer interconnection and wafer-to-wafer bonding is designed to achieve highly miniaturized SAW RF filters. Based on this technology, SAW RF filters for mobile phone systems are developed in the world´s smallest size of 1.0 times 0.8 times 0.25 mm3. It is shown that our newly developed SAW RF filter offers equal frequency characteristics compared with the conventional chip-sized package. And the reliability test result of hermetically sealed SAW filter package will be presented to verify its application to mobile phones. As a result of these developments, wafer-level packaged SAW RF filters will offer considerable advantages over conventional chip-sized packages in many aspects of performance and production, including size, cost, and further integration
Keywords :
hermetic seals; micromechanical devices; mobile handsets; radiofrequency filters; surface acoustic wave filters; wafer level packaging; 0.25 mm; 0.8 mm; 1.0 mm; functional integration; hermetically sealed SAW filter package; mobile phone systems; surface acoustic wave filters; through-wafer interconnection; ultra small SAW RF filter; wafer level packaging technology; wafer-wafer bonding; Acoustic waves; Fabrication; Mobile handsets; Packaging; Radio frequency; SAW filters; Surface acoustic waves; Wafer bonding; Wafer scale integration; Wireless communication;
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
DOI :
10.1109/ULTSYM.2006.62