DocumentCode
2347996
Title
Impact of line voltage sag on switch mode power supply operation
Author
Medora, Nosh K. ; Kusko, Alexander ; Thompson, Marc
Author_Institution
Exponent, Phoenix, AZ
fYear
2008
fDate
3-5 June 2008
Firstpage
2178
Lastpage
2183
Abstract
Switch-mode power supplies (SMPS) provide low-voltage dc power to almost every type of computer, control and instrumentation equipment. As such, the performance of this equipment operating in unprotected ac supply systems reflects the behavior of the SMPS to the voltage surges and sags that are endemic to power systems not protected by UPS. One purpose for this paper is to analyze the operation of SMPS during line voltage sags over and above merely observing the discharge of the dc link capacitor. A further purpose is to show that the tolerance of an SMPS to line-voltage sags can be improved by: (1) using a larger dc capacitor; (2) operating at less than the power rating; and (3) using power factor correction. Inrush current control circuits must be designed to operate effectively for line voltage sags of all predictable depths and time durations. Moreover, voltage disturbance plots of events do not indicate SMPS failures for each event outside the ITI limits. A percentage of SMPS will be operating at part load and not fail.
Keywords
electric current control; power capacitors; power factor correction; power supply quality; surges; switched mode power supplies; uninterruptible power supplies; DC link capacitor; UPS; inrush current control circuits; line voltage sag; low-voltage DC power; power factor correction; switch mode power supply operation; unprotected ac supply systems; voltage surges; Capacitors; Instruments; Power quality; Power supplies; Power system analysis computing; Power system protection; Surge protection; Switched-mode power supply; Switches; Voltage fluctuations; Line voltage sag; SMPS; inrush current control;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-1717-9
Electronic_ISBN
978-1-4244-1718-6
Type
conf
DOI
10.1109/ICIEA.2008.4582904
Filename
4582904
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