Title :
100 MHz IDDQ sensor design with 1 μA resolution for BIST applications
Author :
Antonioli, Yann ; Kinoshita, Kozo ; Nishikawa, Shigeki ; Uemura, Hiroshi
Author_Institution :
Osaka Univ., Japan
Abstract :
This paper presents a high-speed high-resolution IDDQ (power supply quiescent current) sensor design for BIST (built-in self test) applications. The voltage drop is amplified before comparison with a reference voltage to improve sensing resolution. For various CUTs (Circuits Under Test) including Iscas circuits, Spice simulations show speeds up to 100 MHz. A resolution better than 1 μA is achieved while the voltage drop is kept under 0.3 V
Keywords :
CMOS digital integrated circuits; automatic testing; built-in self test; circuit simulation; electric sensing devices; fault diagnosis; integrated circuit testing; leakage currents; 100 MHz; BIST applications; CMOS digital circuits; CUTs; IDDQ sensor design; Iscas circuits; Spice simulations; fault diagnosis; leakage currents; power supply quiescent current; reference voltage; resolution; sensing resolution; voltage drop; Built-in self-test; CMOS process; Circuits; Diodes; Energy consumption; Inverters; Manufacturing processes; Power supplies; Threshold voltage; Voltage control;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730767
