• DocumentCode
    2348180
  • Title

    Eigenvalue sensitivities of excitation system model and parameters

  • Author

    Qingfen Liao ; Dichen Liu ; Cong Zeng ; Liming Ying ; Xue Cui

  • Author_Institution
    Sch. of Electr. Eng., Wuhan Univ., Wuhan
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    2239
  • Lastpage
    2243
  • Abstract
    Based on the theory of dynamic stability of small disturbance, several typical excitation system models in power system analysis software package (PSASP) are connected to the Phillips-Heffron model in this paper. It derives the detailed excitation system model used for the analysis of low-frequency oscillation in power system and then the particular model is extended to the multi-machine system. An improved eigenvalue sensitivity concept is presented to discuss the effects that different excitation system models and parameters have on low-frequency oscillation .The simulation results show that some parameters of the excitation controller can affect low-frequency oscillation mode clearly and so it is of great importance to set, to identify and to measure these parameters.
  • Keywords
    eigenvalues and eigenfunctions; oscillations; power system analysis computing; power system dynamic stability; power system faults; sensitivity analysis; Phillips-Heffron model; dynamic stability; eigenvalue sensitivity; excitation system model; low-frequency oscillation; power system analysis software package; power system disturbance; Eigenvalues and eigenfunctions; Power system analysis computing; Power system dynamics; Power system interconnection; Power system modeling; Power system simulation; Power system stability; Software packages; Stability analysis; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582915
  • Filename
    4582915