Title :
A new analog parametric self-disconnecting BIC sensor class
Author :
Mocanu, O.D. ; Oliver, J.
Author_Institution :
Comput. Sci. Dept., Univ. Autonoma de Barcelona, Spain
Abstract :
We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work with analog circuits, continuously monitoring a given current. As a particular case, the self-disconnecting BICS (SD BICS) can be applied to digital circuits. The values of the current sensibility are programmable, both at design and functioning time. They are self-disconnecting/connecting, meaning that whether an overshoot current is detected, they disconnect the CUT by lowering (raising) the virtual Vdd (ground) potential. This implies that the circuit is actually cut from the power supply and invokes a negligible power consumption in an erroneous state. If at some moment, the CUT regains its normal functioning state, the SD BICS automatically resumes supervising it. We make theoretical considerations of how to design the SD BICS, give HSpice simulation results and refer to some of the applications
Keywords :
SPICE; analogue integrated circuits; automatic testing; built-in self test; circuit simulation; electric sensing devices; integrated circuit testing; HSpice simulation; analog circuits; current sensibility; normal functioning state; overshoot current; self-disconnecting BIC sensor; Circuit testing; Computer science; Computerized monitoring; Digital circuits; Energy consumption; Joining processes; Proposals; Read only memory; Resumes; Sensor phenomena and characterization;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730771