DocumentCode
2348249
Title
A new analog parametric self-disconnecting BIC sensor class
Author
Mocanu, O.D. ; Oliver, J.
Author_Institution
Comput. Sci. Dept., Univ. Autonoma de Barcelona, Spain
fYear
1998
fDate
12-13 Nov 1998
Firstpage
78
Lastpage
81
Abstract
We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work with analog circuits, continuously monitoring a given current. As a particular case, the self-disconnecting BICS (SD BICS) can be applied to digital circuits. The values of the current sensibility are programmable, both at design and functioning time. They are self-disconnecting/connecting, meaning that whether an overshoot current is detected, they disconnect the CUT by lowering (raising) the virtual Vdd (ground) potential. This implies that the circuit is actually cut from the power supply and invokes a negligible power consumption in an erroneous state. If at some moment, the CUT regains its normal functioning state, the SD BICS automatically resumes supervising it. We make theoretical considerations of how to design the SD BICS, give HSpice simulation results and refer to some of the applications
Keywords
SPICE; analogue integrated circuits; automatic testing; built-in self test; circuit simulation; electric sensing devices; integrated circuit testing; HSpice simulation; analog circuits; current sensibility; normal functioning state; overshoot current; self-disconnecting BIC sensor; Circuit testing; Computer science; Computerized monitoring; Digital circuits; Energy consumption; Joining processes; Proposals; Read only memory; Resumes; Sensor phenomena and characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location
San Jose, CA
Print_ISBN
0-8186-9191-3
Type
conf
DOI
10.1109/IDDQ.1998.730771
Filename
730771
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