• DocumentCode
    2348249
  • Title

    A new analog parametric self-disconnecting BIC sensor class

  • Author

    Mocanu, O.D. ; Oliver, J.

  • Author_Institution
    Comput. Sci. Dept., Univ. Autonoma de Barcelona, Spain
  • fYear
    1998
  • fDate
    12-13 Nov 1998
  • Firstpage
    78
  • Lastpage
    81
  • Abstract
    We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work with analog circuits, continuously monitoring a given current. As a particular case, the self-disconnecting BICS (SD BICS) can be applied to digital circuits. The values of the current sensibility are programmable, both at design and functioning time. They are self-disconnecting/connecting, meaning that whether an overshoot current is detected, they disconnect the CUT by lowering (raising) the virtual Vdd (ground) potential. This implies that the circuit is actually cut from the power supply and invokes a negligible power consumption in an erroneous state. If at some moment, the CUT regains its normal functioning state, the SD BICS automatically resumes supervising it. We make theoretical considerations of how to design the SD BICS, give HSpice simulation results and refer to some of the applications
  • Keywords
    SPICE; analogue integrated circuits; automatic testing; built-in self test; circuit simulation; electric sensing devices; integrated circuit testing; HSpice simulation; analog circuits; current sensibility; normal functioning state; overshoot current; self-disconnecting BIC sensor; Circuit testing; Computer science; Computerized monitoring; Digital circuits; Energy consumption; Joining processes; Proposals; Read only memory; Resumes; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-8186-9191-3
  • Type

    conf

  • DOI
    10.1109/IDDQ.1998.730771
  • Filename
    730771