Title :
Power quality disturbances detection and location using mathematical morphology and complex wavelet transformation
Author :
Xue, Cui ; Hui-jin, Liu ; Quan-ming, Zhang ; Li-ming, Ying ; Qing-fen, Liao
Author_Institution :
Sch. of Electr. Eng., Wuhan Univ., Wuhan
Abstract :
Bused on mathematical morphology (MM) and complex wavelet, a novel method on power quality (PQ) disturbance detection and location is presented in this paper. At first, a generalized morphology filter with horizontal linear structure elements is designed to filter impulses and random white noises in PQ disturbance signals. Numerical simulation results show that the characteristics of the original signal can be well retained and the noise interferences are suppressed effectively with the proposed filter method. Then, to the filtered results, the complex wavelet derived by Daubechies real wavelet and its compound information are applied to detect and locate the start and end time that the disturbance occurs. The voltage interruption, voltage sag, voltage swell, high frequency oscillation and harmonic distortion are used to verify the validity of the filter-location approach. Simulation results show the integrated detection approach of morphology-complex wavelet is valid and effective. Besides, it can reduce calculation time and can be implemented easily in the available hardware.
Keywords :
fault location; harmonic distortion; interference suppression; mathematical morphology; power harmonic filters; power supply quality; power system faults; wavelet transforms; white noise; complex wavelet transformation; filter-location approach; generalized morphology filter; harmonic distortion; high frequency oscillation; horizontal linear structure elements; mathematical morphology; noise interference suppression; power quality disturbances detection; power quality disturbances location; random white noises; voltage interruption; voltage sag; voltage swell; Information filtering; Information filters; Interference suppression; Morphology; Nonlinear filters; Numerical simulation; Power quality; Signal design; Voltage fluctuations; White noise;
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
DOI :
10.1109/ICIEA.2008.4582920