High power, electron-beam induced switching in diamond

Author

Scarpetti, R.D. ; Hofer, W.W. ; Kania, D.R. ; Schoenbach, K.H. ; Joshi, R.P. ; Molina, C. ; Brinkmann, R.P.

Volume

fYear

1993

fDate

21-23 June 1993

Firstpage

813

Keywords

Aluminum; Artificial intelligence; Cathodes; Contacts; Contracts; Electron beams; Laboratories; Switches; Thermal conductivity; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference, 1993. Digest of Technical Papers., Ninth IEEE International

Conference_Location

Albuquerque, NM, USA

Print_ISBN

0-7803-1415-8

Type

DOI

10.1109/PPC.1993.514046

Filename

514046

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