Title :
High performance fault simulation for digital systems
Author :
Hahanov, Vladimir ; Krivoulya, Gennadiy ; Hahanova, Irina ; Melnikova, Olga ; Obrizan, Vladimir
Abstract :
Fast backtraced deductive-parallel fault simulation method oriented on processing of complex digital devices containing hundreds of thousand equivalent gates is offered. Data structures and algorithms for method realization are described
Keywords :
automatic test pattern generation; digital circuits; fault simulation; graph theory; logic gates; ATPG; back traced simulation; data structure; deductive-parallel fault simulation; digital device; digital system; fault analysis model; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Digital systems; Electrical fault detection; Equations; Fault detection; System testing;
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on
Conference_Location :
Lviv
Print_ISBN :
0-7803-8138-6
DOI :
10.1109/IDAACS.2003.1249593
