DocumentCode
2348713
Title
Ohmic metal self-aligned gate power double-hetero FET for unity supply voltage operation in digital cellular
Author
Nishitsuji, M. ; Masato, H. ; Morimoto, S. ; Inoue, K. ; Ota, Y.
Author_Institution
Electron. Res. Lab., Matsushita Electron. Corp., Osaka, Japan
fYear
1996
fDate
26-26 June 1996
Firstpage
130
Lastpage
131
Abstract
The objective of this work is to demonstrate a newly developed power HFET operable with low and unity supply voltage with a ohmic metal self-alignment FET process and an asymmetric double-hetero epitaxial structure. We have introduced a new self-alignment process to reduce parasitic resistances for low voltage operated power FETs, where the distance between the drain and the source has been minimized and consequently a knee voltage V/sub k/ in the I-V characteristics has been reduced. This newly developed FET was named OMEGA (ohmic metal self-aligned gate) FET. The results obtained indicate the new FET is highly suited for unity power applications and consequently contribute to minimize the battery cell and the size of microwave mobile communication handsets.
Keywords
cellular radio; digital radio; junction gate field effect transistors; power field effect transistors; I-V characteristics; OMEGA; asymmetric double-hetero epitaxial structure FET; digital cellular; knee voltage; low voltage operation; microwave mobile communication handset; ohmic metal self-aligned gate; parasitic resistance; power HFET; unity supply voltage; Batteries; Double-gate FETs; Electrodes; Gallium arsenide; Knee; Low voltage; Resists; Substrates; Telephone sets; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-3358-6
Type
conf
DOI
10.1109/DRC.1996.546342
Filename
546342
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