DocumentCode :
234876
Title :
Advancements in fabrication of glass interposers
Author :
Shorey, Aric ; Cochet, Philippe ; Huffman, Alan ; Keech, John ; Lueck, M. ; Pollard, Stephen ; Ruhmer, Klaus
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
20
Lastpage :
25
Abstract :
There is growing interest in applying glass as an interposer substrate for 2.5D/3D as well as component substrates for radio frequency (RF) applications. The list of important advantages provided by glass in these applications include material properties (e.g. electrical performance, ability to adjust coefficient of thermal expansion (CTE) to improve reliability) as well as the significant opportunities for cost advantages that glass based solutions provide over other approaches. The feasibility of fabricating high quality holes in glass substrates has been demonstrated. While work in hole fabrication continues, additional efforts to demonstrate and mature downstream processing of glass substrates has accelerated. These include hole metallization and redistribution layers (RDL) in both wafer and panel formats, as well as initial characterization and demonstration of reliability. Significant progress in these areas is reported here.
Keywords :
integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; integrated circuit reliability; radiofrequency integrated circuits; three-dimensional integrated circuits; 2.5D integrated circuit; 3D integrated circuit; glass interposer fabrication; glass substrate hole; hole metallization; integrated circuit reliability; radio frequency application; redistribution layers; thermal expansion; Fabrication; Glass; Lithography; Metallization; Reliability; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897261
Filename :
6897261
Link To Document :
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