DocumentCode :
2348817
Title :
4E-1 Quantitative Determination of Lateral Mode Dispersion in Film Bulk Acoustic Resonators through Laser Acoustic Imaging
Author :
Telschow, Ken L. ; Larson, John D., III
Author_Institution :
Idaho Nat. Lab., Idaho Falls, ID
fYear :
2006
fDate :
2-6 Oct. 2006
Firstpage :
448
Lastpage :
451
Abstract :
Film bulk acoustic resonators are useful for many signal processing applications. Detailed knowledge of their properties is needed to optimize their design for specific applications. The finite size of these resonators precludes their use in single acoustic modes; rather, multiple wave modes, such as, lateral wave modes are always excited concurrently. In order to determine the contributions of these modes, we have been using a newly developed full-field laser acoustic imaging approach to directly measure their amplitude and phase throughout the resonator. This paper describes new results comparing modeling including both elastic and piezoelectric effects in the active material with imaging measurement of all excited modes. Fourier transformation of the acoustic amplitude and phase displacement images provides a quantitative determination of excited mode amplitude and wavenumber at any frequency. Images combined at several frequencies form a direct visualization of lateral mode excitation and dispersion for the device under test allowing mode identification and comparison with predicted operational properties. Discussion and analysis are presented for modes near the first longitudinal thickness resonance (~900 MHz) in an AlN thin film resonator. Plate wave modeling, taking account of material crystalline orientation, elastic and piezoelectric properties and overlayer metallic films, is discussed in relation to direct image measurements
Keywords :
acoustic dispersion; acoustic imaging; acoustic resonators; acoustic signal processing; bulk acoustic wave devices; AlN; AlN thin film resonator; Fourier transformation; acoustic amplitude; acoustic signal processing; elastic effects; elastic properties; film bulk acoustic resonators; laser acoustic imaging; lateral mode dispersion; lateral mode excitation; lateral wave modes; longitudinal thickness resonance; material crystalline orientation; metallic films; multiple wave modes; phase displacement images; piezoelectric effects; piezoelectric properties; plate wave modeling; single acoustic modes; Acoustic imaging; Acoustic measurements; Acoustic signal processing; Acoustic waves; Film bulk acoustic resonators; Frequency; Laser excitation; Laser modes; Piezoelectric films; Piezoelectric materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
ISSN :
1051-0117
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2006.98
Filename :
4151954
Link To Document :
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