Title :
6D-2 Wavenumber Domain Analysis of Two-Dimensional SAW Images Captured by Phase-Sensitive Laser Probe System
Author :
Hashimoto, Ken-Ya ; Omori, Tatsuya ; Yamaguchi, Masatsune ; Watanabe, Masashi ; Kamizuma, Hiroshi
Author_Institution :
Dept. of Electron. & Mech. Eng., Chiba Univ.
Abstract :
This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional images captured by phase-sensitive laser probe systems is effective in selective characterisation of unwanted responses of RF SAW devices. The authors have recently reported the development of a high-speed and phase-sensitive laser probe system. Since the distance between two adjacent points of measurement is constant and calibrated, the 2D fast Fourier transform (FFT) and inverse FFT are directly applicable to the measured SAW field for the wavenumber domain analysis. This analysis offers various additional information of spurious signals. Effectiveness of the wavenumber domain analysis is demonstrated through the characterisation of spurious resonance modes and scattered non-guided modes appearing in SAW resonators fabricated on ST quartz substrate
Keywords :
acoustic signal processing; fast Fourier transforms; quartz; surface acoustic wave resonators; 2D SAW images; 2D fast Fourier transform; RF SAW devices; SAW resonators; ST quartz substrate; inverse FFT; phase-sensitive laser probe system; radiofrequency surface acoustic wave devices; scattered nonguided modes; spurious resonance modes; spurious signals; wavenumber domain analysis; Fast Fourier transforms; Image analysis; Information analysis; Probes; Radio frequency; Resonance; Scattering; Signal analysis; Surface acoustic wave devices; Surface acoustic waves;
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
DOI :
10.1109/ULTSYM.2006.106