DocumentCode :
2349058
Title :
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction
Author :
Benware, Brady ; Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, J. ; Solecki, Jedrzej ; Tyszer, J.
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
fYear :
2011
fDate :
23-27 May 2011
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The scheme is based on a very simple test response compactor employing orthogonal- spatial and time- signatures. The advantage of this scheme as compared to previous work in this field is the simple and incremental nature of the compaction hardware required. The ability of the scheme to accurately identify failing scan cells from compacted responses has been measured on production fail data from five industrial designs and is reported herein.
Keywords :
fault diagnosis; logic design; logic testing; failing scan cell diagnosis; failing scan cell identification; orthogonal response compaction; orthogonal-spatial signature; orthogonal-time signature; production test response; scan compression; test response compactor; Bipartite graph; Built-in self-test; Circuit faults; Compaction; Fault diagnosis; Logic gates; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
ISSN :
1530-1877
Print_ISBN :
978-1-4577-0483-3
Electronic_ISBN :
1530-1877
Type :
conf
DOI :
10.1109/ETS.2011.56
Filename :
5957914
Link To Document :
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