DocumentCode
234906
Title
Accelerated vibration reliability testing of electronic assemblies using sine dwell with resonance tracking
Author
Quang Su ; Pitarresi, James ; Gharaibeh, Mohammad ; Stewart, Aaron ; Joshi, Gauri ; Anselm, Martin
Author_Institution
Dept. of Mech. Eng., Binghamton Univ., Binghamton, NY, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
119
Lastpage
125
Abstract
In this work a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using both the resonance tracking sinusoidal test method and the traditional fixed-frequency method for assemblies, each consisting of a centrally mounted BGA device assembled with SAC305 solder. These tests show that the resonance tracking method gives more consistent failure times than the fixed frequency method. Failure analysis for the tested devices shows the primary failure mode is trace failure with evidence of solder fatigue. A finite element model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while for accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related finite element models provide the building blocks for high cycle solder fatigue plots (i.e., S-N curves).
Keywords
ball grid arrays; dynamic testing; failure analysis; life testing; reliability; vibration control; vibration measurement; BGA device; accelerated vibration reliability testing; circuit assemblies; electrical failures; electrodynamic shaker; electronic assemblies; excitation frequency; failure analysis; finite element models; fixed frequency method; harmonic vibration data; real time vibration control; resistance monitoring; resonance tracking; resonant frequency; sine dwell; sinusoidal vibration test method; vibration logging; vibration measurement techniques; Assembly; Finite element analysis; Monitoring; Printed circuits; Resonant frequency; Testing; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897276
Filename
6897276
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