• DocumentCode
    234906
  • Title

    Accelerated vibration reliability testing of electronic assemblies using sine dwell with resonance tracking

  • Author

    Quang Su ; Pitarresi, James ; Gharaibeh, Mohammad ; Stewart, Aaron ; Joshi, Gauri ; Anselm, Martin

  • Author_Institution
    Dept. of Mech. Eng., Binghamton Univ., Binghamton, NY, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    119
  • Lastpage
    125
  • Abstract
    In this work a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using both the resonance tracking sinusoidal test method and the traditional fixed-frequency method for assemblies, each consisting of a centrally mounted BGA device assembled with SAC305 solder. These tests show that the resonance tracking method gives more consistent failure times than the fixed frequency method. Failure analysis for the tested devices shows the primary failure mode is trace failure with evidence of solder fatigue. A finite element model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while for accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related finite element models provide the building blocks for high cycle solder fatigue plots (i.e., S-N curves).
  • Keywords
    ball grid arrays; dynamic testing; failure analysis; life testing; reliability; vibration control; vibration measurement; BGA device; accelerated vibration reliability testing; circuit assemblies; electrical failures; electrodynamic shaker; electronic assemblies; excitation frequency; failure analysis; finite element models; fixed frequency method; harmonic vibration data; real time vibration control; resistance monitoring; resonance tracking; resonant frequency; sine dwell; sinusoidal vibration test method; vibration logging; vibration measurement techniques; Assembly; Finite element analysis; Monitoring; Printed circuits; Resonant frequency; Testing; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897276
  • Filename
    6897276