• DocumentCode
    2349093
  • Title

    A fault-tolerant network-on-chip design using dynamic reconfiguration of partial-faulty routing resources

  • Author

    Qian, Zhiliang ; Teh, Ying Fei ; Tsui, Chi-ying

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2011
  • fDate
    3-5 Oct. 2011
  • Firstpage
    192
  • Lastpage
    195
  • Abstract
    In this work, we propose a fault-tolerant framework for Network on Chips (NoC) to achieve maximum performance under fault. A fine-grained fault model is first introduced. Different from the traditional link or node NoC fault models which assume the faulty resource to be totally unfunctional, we distinguish the faulty components and handle them according to their fault classes. By doing so, we can avoid unnecessary partitioning of the network and hence achieve a higher connectivity under high fault rate. Two new dynamic reconfiguration schemes at the router level, namely Dynamic Buffer Swapping (DBS) and Dynamic MUX Swapping(DMS), are proposed to deal with the buffer and cross-bar faults accordingly, which are the main sources of failure in the router. In these schemes, the healthy resources in the router are maximally utilized to mitigate the faults. Experimental results show that we can achieve higher packet acceptance rate and lower latency compared with state-of-the-art fault-tolerant routing schemes.
  • Keywords
    fault tolerant computing; integrated circuit design; network routing; network-on-chip; buffer faults; cross-bar faults; dynamic MUX swapping; dynamic reconfiguration schemes; fault-tolerant network-on-chip design; fine-grained fault model; node NoC fault models; partial-faulty routing resources; Circuit faults; Fault tolerance; Fault tolerant systems; Heuristic algorithms; Routing; Satellite broadcasting; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI and System-on-Chip (VLSI-SoC), 2011 IEEE/IFIP 19th International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4577-0171-9
  • Electronic_ISBN
    978-1-4577-0169-6
  • Type

    conf

  • DOI
    10.1109/VLSISoC.2011.6081674
  • Filename
    6081674