• DocumentCode
    234928
  • Title

    Porous silicon technology, a breakthrough for silicon photonics: From packaging to monolithic integration

  • Author

    Balucani, Marco ; Klyshko, A. ; Kholostov, K. ; Benedetti, A. ; Belardini, A. ; Sibilia, C. ; Izzi, Massimo ; Tucci, Mauro ; Bandarenka, H. ; Bondarenko, V.

  • Author_Institution
    DIET, Sapienza Univ. of Rome, Rome, Italy
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    194
  • Lastpage
    202
  • Abstract
    Low cost concept based on the porous silicon technology is shown to be well suitable for integrating monolithically the photonic devices on a standard silicon wafers by using localized SOI structures fabricated by electrochemical anodization of silicon wafers followed by thermal oxidation of porous silicon. The new approach consists in realizing buried localized porous oxidized silicon by exploiting two different routes: n- epi/n+/n- structures on p-type wafers and ion-implantation on standard CMOS/BiCMOS wafers. The peculiarities of the developed approach, including anodization and thermal oxidation regimes to form oxidized porous silicon regions with the required properties are presented. The advantages of the proposed approach in realizing the fiber-to-chip and power-over-fiber coupling are discussed.
  • Keywords
    BiCMOS integrated circuits; anodisation; elemental semiconductors; ion implantation; oxidation; porous semiconductors; silicon; silicon-on-insulator; wafer level packaging; Si; electrochemical anodization; fiber-to-chip coupling; ion implantation; localized SOI structures; monolithic integration; n- epi-n+-n- structures; p-type wafers; packaging; photonic devices; porous silicon technology; power-over-fiber coupling; silicon photonics; standard CMOS-BiCMOS wafers; standard silicon wafers; thermal oxidation; Couplings; Optical fiber sensors; Optical fibers; Silicon photonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897288
  • Filename
    6897288