DocumentCode
2349288
Title
Extraction of EVM from Transmitter System Parameters
Author
Nassery, Afsaneh ; Ozev, Sule ; Verhelst, Marian ; Slamani, Mustapha
Author_Institution
Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear
2011
fDate
23-27 May 2011
Firstpage
75
Lastpage
80
Abstract
Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. Since EVM is analytically related to system impairments, which are typically measured in a production test environment, it can be eliminated from the test list if the relations between EVM and system impairments are derived in a manner that is independent of the circuit implementation and manufacturing process. In this paper, we focus on the WLAN standard, and derive the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems: IQ imbalance, non-linearity, and noise. Simulations and hardware experiments show that the accuracy of the analytical models is in par with a direct EVM measurement with a reasonable test time.
Keywords
OFDM modulation; analogue circuits; circuit testing; production testing; quadrature amplitude modulation; radio transmitters; wireless LAN; EVM extraction; EVM measurement; IQ imbalance; QAM-OFDM based system; WLAN standard; advanced communication standard; circuit implementation; error vector magnitude; manufacturing process; production test environment; test development; tester resource; transmitter system parameter; Analytical models; Equations; Mathematical model; Noise; OFDM; Quadrature amplitude modulation; Wireless LAN;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location
Trondheim
ISSN
1530-1877
Print_ISBN
978-1-4577-0483-3
Electronic_ISBN
1530-1877
Type
conf
DOI
10.1109/ETS.2011.46
Filename
5957926
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