• DocumentCode
    2349291
  • Title

    4E-2 2D-FEM Modeling of Mirror-Type FBARs Based on an Adapted Set of Material Parameters

  • Author

    Link, A. ; Schmidhammer, E. ; Mayer, M. ; Bader, B. ; Wagner, K. ; Weigel, R.

  • Author_Institution
    Inst. for Electron. Eng., Erlangen-Nuremberg Univ., Erlangen
  • fYear
    2006
  • fDate
    2-6 Oct. 2006
  • Firstpage
    452
  • Lastpage
    455
  • Abstract
    Film bulk acoustic resonators (FBARs) show many unwanted "spurious modes". They all are energy-trapped modes and therefore arise - in addition to the main resonance - as ripples in the resonator\´s admittance. Furthermore, non-trapped modes reduce resonator quality due to leaking energy to the environment of the resonator. Since the excitation of both spurious and non-trapped modes has been identified as one of the main factors limiting the performance of high-quality FBAR-based filters and duplexers, there is a high demand for the accurate prediction of the appearance of these unwanted modes. Starting point of our simulations was the adaptation of a material parameter set. In order to do that we fitted calculated dispersion curves to measured dispersion characteristics in a very wide frequency range by varying stiffness constants systematically. Based on the resulting material data set we iteratively performed 2D-FEM simulations in order to improve our mesh, adapted the viscous losses, and added lumped elements to account for dielectric and resistive losses. The final FEM-model in combination with the optimized material parameter set shows an excellent agreement of measurement and simulation
  • Keywords
    acoustic resonators; bulk acoustic wave devices; dielectric losses; finite element analysis; 2D-FEM modeling; dielectric loss; dispersion curves; duplexers; energy-trapped modes; film bulk acoustic resonators; finite element model; high-quality FBAR-based filters; mirror-type FBAR; resistive loss; resonator admittance; stiffness constants; viscous loss; Admittance; Band pass filters; Dielectric losses; Dielectric materials; Dielectric measurements; Dispersion; Film bulk acoustic resonators; Frequency measurement; Resonance; Resonator filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2006. IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1051-0117
  • Print_ISBN
    1-4244-0201-8
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2006.121
  • Filename
    4151977