Title :
4E-2 2D-FEM Modeling of Mirror-Type FBARs Based on an Adapted Set of Material Parameters
Author :
Link, A. ; Schmidhammer, E. ; Mayer, M. ; Bader, B. ; Wagner, K. ; Weigel, R.
Author_Institution :
Inst. for Electron. Eng., Erlangen-Nuremberg Univ., Erlangen
Abstract :
Film bulk acoustic resonators (FBARs) show many unwanted "spurious modes". They all are energy-trapped modes and therefore arise - in addition to the main resonance - as ripples in the resonator\´s admittance. Furthermore, non-trapped modes reduce resonator quality due to leaking energy to the environment of the resonator. Since the excitation of both spurious and non-trapped modes has been identified as one of the main factors limiting the performance of high-quality FBAR-based filters and duplexers, there is a high demand for the accurate prediction of the appearance of these unwanted modes. Starting point of our simulations was the adaptation of a material parameter set. In order to do that we fitted calculated dispersion curves to measured dispersion characteristics in a very wide frequency range by varying stiffness constants systematically. Based on the resulting material data set we iteratively performed 2D-FEM simulations in order to improve our mesh, adapted the viscous losses, and added lumped elements to account for dielectric and resistive losses. The final FEM-model in combination with the optimized material parameter set shows an excellent agreement of measurement and simulation
Keywords :
acoustic resonators; bulk acoustic wave devices; dielectric losses; finite element analysis; 2D-FEM modeling; dielectric loss; dispersion curves; duplexers; energy-trapped modes; film bulk acoustic resonators; finite element model; high-quality FBAR-based filters; mirror-type FBAR; resistive loss; resonator admittance; stiffness constants; viscous loss; Admittance; Band pass filters; Dielectric losses; Dielectric materials; Dielectric measurements; Dispersion; Film bulk acoustic resonators; Frequency measurement; Resonance; Resonator filters;
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
DOI :
10.1109/ULTSYM.2006.121